| 摘要 |
PROBLEM TO BE SOLVED: To obtain an LCD function inspecting device in which impedance caused by connection is reduced and the occurrence of erroneous display is prevented, by conducting a function inspection in which plural probe pins, that are connected to a same signal source, are connected against a single external connection pattern of an LCD. SOLUTION: An LCD driver 2 is connected to an ITO pattern 3 as much as the number of respective segment, the driver 2 is driven by providing a signal from the external to the ITO pattern 3 and acts as a display. Two probe pins 4 are connected to a same terminal of a control BOX 5. By making the probe pins 4 two and making the pins approach and bring into contact with the same ITO pattern 3, impedance is reduced to 1/2. Therefore, the correction for the phases, the waveforms and the timing of the signal is not required. Moreover, even through one piece of the probe pins 4 causes a contact defect, the remaining one pin 4 maintains the connection.
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