COLUMN REPAIR APPARATUS FOR SEMICONDUCTOR MEMORY

摘要

PURPOSE: A column repair apparatus for a semiconductor memory is provided to minimize a chip size required when operating a column repair and to reduce delay time when operating the column repair by alternating an input and output line to a redundancy input and output line. CONSTITUTION: A reconfiguration controller(400) reads data of a fuse in which a fail is occurred and outputs a signal to a fail input and output line for switching a data line suitable for a bank approached when operating a column of a memory. A data line switching decoder(401) receives the signal to the fail input and output line from the reconfiguration controller(400) and decodes the received signal. A data line reconfiguration unit(402) switches the fail input and output line of a memory cell array unit(403) to a redundancy input and output line according to a decoding signal of the data line switching decoder(401).