发明名称 PROCESS MEASURING THICKNESS OF THIN LAYER OF CLEAR LIQUID
摘要 FIELD: optical measurement, contact-free determination of thickness of layers of clear liquids in paint and varnish, chemical and electronic industries, physical and chemical instruments. SUBSTANCE: process employs phenomenon of thermal-capillary convection excited by laser radiation in layer of liquid that leads to dynamic deformation of its free surface in the form axially symmetric depression. Thickness of layer is found by diameter of interference pattern viewed on screen positioned in cross-section of caustic from reflected beam of laser and having form of concentric circumferences. EFFECT: increased measurement accuracy, simplified circuit design and measurement process, expanded range of measurement of layers of optically clear liquids on frosted surface absorbing radiation. 4 dwg
申请公布号 RU2149353(C1) 申请公布日期 2000.05.20
申请号 RU19980114578 申请日期 1998.07.27
申请人 TJUMENSKIJ GOSUDARSTVENNYJ UNIVERSITET 发明人 BEZUGLYJ B.A.;TARASOV O.A.;FEDORETS A.A.;SHEPELENOK S.V.
分类号 G01B11/06;(IPC1-7):G01B11/06 主分类号 G01B11/06
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