| 摘要 |
PROBLEM TO BE SOLVED: To provide a working mode fixing circuit for semiconductor device which can analyze the failure of a semiconductor device by not using any exclusively used testing jig, such as the probe card, socket, etc., but using a manual probe. SOLUTION: In a semiconductor device provided with an internal circuit 1 having a prescribed working mode, a plurality of pads 2 for driving circuit which are connected to the circuit 1, a power supply pad 3, and a ground pad 4 all of which are formed on a chip, each pad 2 for driving circuit is connected to a power source or ground through a transistor 6. In addition, a switching circuit 5 which connects the gates of the transistors 6 to a common operation fixing pad 7 is formed on the chip.
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