CONTACT PROBE

摘要

PROBLEM TO BE SOLVED: To prevent contact pins from having deformation variation at overdriving. SOLUTION: This probe 1 is constituted by forming pattern wires 3 on the surface of a film body 2 and projecting the tips of the pattern wires from the tip part of the film body as contact pins 3a. Here, a belt-like film 4 is provided, which supports the contact pins 3a by connecting them with one another at their intermediate parts.