发明名称 MOS thin film transistor and method of fabricating same
摘要 <p>There is provided a crystalline TFT in which reliability comparable to or superior to a MOS transistor can be obtained and excellent characteristics can be obtained in both an on state and an off state. A gate electrode of the crystalline TFT is formed of a laminate structure of a first gate electrode made of a semiconductor material and a second gate electrode made of a metal material. An n-channel TFT includes an LDD region, and a region overlapping with the gate electrode and a region not overlapping with the gate electrode are provided, so that a high electric field in the vicinity of a drain is relieved, and at the same time, an increase of an off current is prevented. <IMAGE></p>
申请公布号 EP1006589(A2) 申请公布日期 2000.06.07
申请号 EP19990124230 申请日期 1999.12.03
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI, SHUNPEI;OHTANI, HISASHI;SUZAWA, HIDEOMI;TAKAYAMA, TORU
分类号 H01L21/28;G02F1/1362;G02F1/1368;H01L21/77;H01L21/84;H01L27/12;H01L29/49;H01L29/786;(IPC1-7):H01L29/49;H01L21/336;G02F1/136 主分类号 H01L21/28
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