发明名称 |
FORMING METHOD OF TUNGSTEN PLUG IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A forming method of a tungsten plug is to prevent the occurrence of a hole recess due to excessive etching on forming the tungsten plug, thereby satisfactorily embedding a contact hole and securing the stability and easiness of the subsequent manufacturing process. CONSTITUTION: A forming method of a tungsten plug comprises the steps of: providing a semiconductor substrate(21) on which an interlayer isolated film(22) having a contact hole(23) is formed; forming a tungsten layer on the interlayer isolated layer including the contact hole; forming a photoresist pattern on the tungsten layer at the upper part of the contact hole; etching the exposed part of the tungsten layer by the described depth with an etching process using the photoresist pattern as an etching mask; and removing the photoresist pattern, followed by forming a tungsten plug(25a) having a convex surface in the contact hole by etching the whole surface of previously etched tungsten layer.
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申请公布号 |
KR20000043062(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980059365 |
申请日期 |
1998.12.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, JIN HYEON;LEE, IN HAENG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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