发明名称 |
EXPOSURE METHOD USING DIFFERENT KINDS OF ALIGNMENT EXPOSURE APPARATUS |
摘要 |
PURPOSE: An exposure method using different kinds of alignment exposure apparatus is to decrease the production cost of semiconductor fabrication equipment and effectively use the exposure apparatus. CONSTITUTION: An exposure method using different kinds of alignment exposure apparatus comprises the steps of: providing a substrate; forming an objective layer on the substrate; coating a photoresist film on the objective layer; and defining the photoresist film by using either a stepper type alignment exposure apparatus or a scanner type alignment apparatus depending on the property of the objective layer. The objective layer is an intermetallic dielectric layer including a contact hole. The scanner type alignment exposure apparatus has an exposure characteristic lower than the stepper type alignment exposure apparatus. |
申请公布号 |
KR20000056246(A) |
申请公布日期 |
2000.09.15 |
申请号 |
KR19990005384 |
申请日期 |
1999.02.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NAM, SEUNG HYEONG;JANG, TAE HO |
分类号 |
H01L21/768;G03F1/08;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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