发明名称 EXPOSURE METHOD USING DIFFERENT KINDS OF ALIGNMENT EXPOSURE APPARATUS
摘要 PURPOSE: An exposure method using different kinds of alignment exposure apparatus is to decrease the production cost of semiconductor fabrication equipment and effectively use the exposure apparatus. CONSTITUTION: An exposure method using different kinds of alignment exposure apparatus comprises the steps of: providing a substrate; forming an objective layer on the substrate; coating a photoresist film on the objective layer; and defining the photoresist film by using either a stepper type alignment exposure apparatus or a scanner type alignment apparatus depending on the property of the objective layer. The objective layer is an intermetallic dielectric layer including a contact hole. The scanner type alignment exposure apparatus has an exposure characteristic lower than the stepper type alignment exposure apparatus.
申请公布号 KR20000056246(A) 申请公布日期 2000.09.15
申请号 KR19990005384 申请日期 1999.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM, SEUNG HYEONG;JANG, TAE HO
分类号 H01L21/768;G03F1/08;G03F1/68;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/768
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