发明名称 |
Production of semiconductor wafers comprises simultaneously polishing front and rear sides of each wafer between polishing plates covered with cloth, evaluating and then re-polishing |
摘要 |
Production of a number of semiconductor wafers comprises simultaneously polishing the front and rear sides of each wafer between polishing plates covered with a cloth and with the introduction of a polishing agent; polishing the front side of each wafer on a polishing plate; evaluating each wafer; re-polishing the front side of each wafer; and re-evaluating the each wafer with respect to the quality and returning to re-polishing step. Preferred Features: The material removed from each wafer in the first step is 3-170 microns m. The polishing agent contains 0.5-10 wt.% and has a pH of 9-12.
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申请公布号 |
DE10012840(A1) |
申请公布日期 |
2001.04.26 |
申请号 |
DE20001012840 |
申请日期 |
2000.03.16 |
申请人 |
WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG |
发明人 |
WENSKI, GUIDO;BUSCHHARDT, THOMAS;HENNHOEFER, HEINRICH;LICHTENEGGER, BRUNO |
分类号 |
B24B37/04;B24B49/02;C30B33/00;H01L21/306;(IPC1-7):H01L21/302;B28D5/00 |
主分类号 |
B24B37/04 |
代理机构 |
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主权项 |
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地址 |
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