| 摘要 |
The invention relates to a sensor for the contact measurement of materials, whereby the item (2) to be measured is placed on a supporting surface (3) or led over the supporting surface (3). The sensor comprises a means for measuring the distance between the sensor mimetics and the supporting surface (3), a probe element (4) to contact the item (2) to be measured, whereby the probe element (4) is movably mounted in the z-direction i.e. essentially perpendicular to the surface of the item (2) to be measured, a means of measuring the position of the probe element (4) and an analytical unit for evaluating the measured separation data and positional data. The probe element (4) is freely mounted in the z-direction, at least within the range of the expected maximum measured movement, in such a way that deformation of the item (2) to be measured is, for the most part, avoided. Furthermore, the means for measuring the position of the probe element (4) operates in a contact free manner.
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