发明名称 |
CLEANING METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A cleaning method for manufacturing a semiconductor device is provided to optimize cleaning of a wafer and to minimize a process defect caused by particles, by spraying gas through a groove installed between slots of a hood while the wafer stands by inside the hood. CONSTITUTION: Process gas is sprayed through a groove(50) formed between slots(40) of a hood(30) to prevent influence by the increase of cleaning liquid while a wafer stands by in the hood, so that portions(35,37) above and under the wafer in the hood are filled with the process gas. Mixture gas is sprayed at a position above the hood in a dry process in which the wafer is transferred from a process bath to the hood.
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申请公布号 |
KR20020000267(A) |
申请公布日期 |
2002.01.05 |
申请号 |
KR20000034425 |
申请日期 |
2000.06.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHUN U |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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