发明名称 IMPLANT DAMAGE FREE IMAGE SENSOR AND METHOD OF THE SAME
摘要 An image sensor is disclosed. The image sensor includes an epitaxial layer, a plurality of plug structures and an interconnect structure. Wherein the plurality of plug structures are formed in the epitaxial layer, and each plug structure has doped sidewalls, the epitaxial layer and the doped sidewalls form a plurality of photodiodes, the plurality of plug structures are used to separate adjacent photodiodes, and the epitaxial layer and the doped sidewalls are coupled to the interconnect structure via the plug structures. An associated method of fabricating the image sensor is also disclosed. The method includes: providing a substrate having a first-type doped epitaxial substrate layer on a second-type doped epitaxial substrate layer; forming a plurality of isolation trenches in the first-type doped epitaxial substrate layer; forming a second-type doped region along sidewalls and bottoms of the plurality of isolation trenches; and filling the plurality of isolation trenches by depositing metal.
申请公布号 US2016351604(A1) 申请公布日期 2016.12.01
申请号 US201514724055 申请日期 2015.05.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 KALNITSKY ALEXANDER;SZE JHY-JYI;YAUNG DUN-NIAN;WANG CHEN-JONG;HUANG YIMIN;YAMASHITA YUICHIRO
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. An image sensor, comprising: an epitaxial layer; a plurality of plug structures formed in the epitaxial layer, each plug structure having doped sidewalls of the same type of doping conformally formed around the plug structure; and an interconnect structure; wherein the epitaxial layer and the doped sidewalls form a plurality of photodiodes, the plurality of plug structure are used to separate adjacent photodiodes, and the epitaxial layer and the doped sidewalls are coupled to the interconnect structure via the plug structures.
地址 HSINCHU TW