发明名称 |
OPTICAL INSPECTION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an optical inspection apparatus wherein one rectilinear inspection region which scans the surface of a specimen is divided into a plurality of partial inspection regions so as to be sensed by line sensors allocated to the respective partial inspection regions. SOLUTION: Images of the partial inspection regions are turned by 90 deg. by using an optical system inside a plane which is substantially parallel to the surface of the specimen. As a result, one rectilinear inspection region is converted into a plurality of optical images which are separated from each other. Thereby, the line sensors which are housed in a package whose outside shape is larger than a sensor chip can be arranged easily.
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申请公布号 |
JP2002062121(A) |
申请公布日期 |
2002.02.28 |
申请号 |
JP20000247634 |
申请日期 |
2000.08.17 |
申请人 |
KANEKO DENKI KK |
发明人 |
KITANO OSAMU;KANEKO TAKESHI |
分类号 |
G01B11/24;G01B11/245;G01N21/956;H01L27/148;H01L31/0232;H05K3/00;(IPC1-7):G01B11/24;H01L31/023 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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