发明名称 OPTICAL INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an optical inspection apparatus wherein one rectilinear inspection region which scans the surface of a specimen is divided into a plurality of partial inspection regions so as to be sensed by line sensors allocated to the respective partial inspection regions. SOLUTION: Images of the partial inspection regions are turned by 90 deg. by using an optical system inside a plane which is substantially parallel to the surface of the specimen. As a result, one rectilinear inspection region is converted into a plurality of optical images which are separated from each other. Thereby, the line sensors which are housed in a package whose outside shape is larger than a sensor chip can be arranged easily.
申请公布号 JP2002062121(A) 申请公布日期 2002.02.28
申请号 JP20000247634 申请日期 2000.08.17
申请人 KANEKO DENKI KK 发明人 KITANO OSAMU;KANEKO TAKESHI
分类号 G01B11/24;G01B11/245;G01N21/956;H01L27/148;H01L31/0232;H05K3/00;(IPC1-7):G01B11/24;H01L31/023 主分类号 G01B11/24
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