发明名称 Automatic generation of one dimensional data compaction commands for electron beam lithography
摘要 A method, and a system for employing the method, for compacting the amount of memory required to store a two dimensional array of exposure spot shapes in a numerically controlled (NC) electron beam lithography tool. The method includes the steps of: sorting the shapes in a selected line based on the widths and heights of the shapes; identifying and removing from contention a group of shapes in the selected line having common widths and heights; determining a dosage requirement for the shapes in the group; and applying one or more commands based on the group and the determined dosed requirement to enable the NC electron beam lithography tool to draw the two dimensional array of exposure spot shapes. Before the sorting step, the method can include initially selecting whether processing for the shapes is performed on a vertical line or on a horizontal line basis; and applying the sorting step, the identifying step, the determining step and the applying step on a basis not selected in the initially selecting step. The method can also include the steps of: preselecting a minimum number of required common shapes; and performing the identifying and removing step only if the number of shapes in the group equals or exceeds the minimum number.
申请公布号 US6353922(B1) 申请公布日期 2002.03.05
申请号 US19990382107 申请日期 1999.08.24
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DICK GREGORY J.
分类号 H01J37/302;(IPC1-7):G06F7/60;G03F9/00;G06F17/10;G06F19/00;G21K5/10 主分类号 H01J37/302
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