发明名称 SEMICONDUCTOR WAFER DIFFUSION DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor wafer diffusion device and a method of manufacturing a semiconductor device, with which entrainment of the atmosphere into a diffusion furnace can be prevented, when a semiconductor wafer is inserted into the furnace. SOLUTION: The semiconductor wafer diffusion device is equipped with a diffusion furnace 1 for performing diffusion treatment or oxidation treatment of a semiconductor wafer, a first gas inlet port 3 provided at an end of the diffusion furnace for introducing a first inert gas into the diffusion furnace, an insertion port provided at the other end of the diffusion furnace for inserting a board 7 on which a plurality of semiconductor wafers 5 are arranged and placed, a shutter for opening/closing this insertion port, a heater 9 disposed around the diffusion furnace, a second gas inlet 4 provided on a side surface on the other end side of the diffusion furnace for introducing a second inert gas into the diffusion furnace, and a gas discharge port 6 provided on a side surface on the other end side of the diffusion furnace and opposed to the second gas inlet port.
申请公布号 JP2002093730(A) 申请公布日期 2002.03.29
申请号 JP20000280811 申请日期 2000.09.14
申请人 SEIKO EPSON CORP 发明人 SAKASHITA TAKESHI
分类号 H01L21/22;H01L21/31;(IPC1-7):H01L21/22 主分类号 H01L21/22
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