| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of testing the output voltage outputted from the output end of a DUT(device under test) at a DC test according to the variety of the DUT to be measured in a sorter time and measuring a high output voltage outputted from the output end of the DUT. SOLUTION: This semiconductor testing device is provided with a buffer means receiving a DC voltage signal from the output end of the DUT, converting it into a prescribed voltage by buffering current, and outputting and feeding it to the receiving end of a DCTU(DC test unit) by driving a station cable CB. The settling time at the receiving end of the DCTU can be shortened.
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