发明名称 METHOD FOR PRODUCING A DMOS TRANSISTOR
摘要 The invention relates to a method for producing a DMOS transistor structure. The invention is advantageous in that a protective layer (14) is used to protect the already essentially completed DMOS transistor structure from the negative effects of additional process steps. According to the invention, the DMOS gate electrode is not customarily structured, as in the prior art, by using a single lithography step, rather the structuring of the DMOS gate electrode is split between two lithography steps. In a first lithography step, essentially only the source region (9) of the DMOS transistor structure is opened, whereby the electrode layer still present can be used as a mask for the subsequent production of the body region (8).
申请公布号 WO0235600(A2) 申请公布日期 2002.05.02
申请号 WO2001EP12035 申请日期 2001.10.17
申请人 INFINEON TECHNOLOGIES AG;MUELLER, KARLHEINZ;WAGNER, CAJETAN;ROESCHLAU, KLAUS 发明人 MUELLER, KARLHEINZ;WAGNER, CAJETAN;ROESCHLAU, KLAUS
分类号 H01L29/78;H01L21/336;H01L29/423 主分类号 H01L29/78
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