| 摘要 |
PROBLEM TO BE SOLVED: To secure an I/O pad for a test having a size same to an I/O pad used usually, on a circuit chip as required. SOLUTION: In this circuit chip 1, the I/O pad 11 for the test having a surface area same or substantially same to the I/O pad 12 usually used is also formed within a circuit arranging area 13 in which an electronic circuit is formed.
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