| 摘要 |
PROBLEM TO BE SOLVED: To inspect the appearance of a spherical object such as conductive fine particles at a high speed with high accuracy and to certainly inspect the whole of the spherical object without missing abnormality. SOLUTION: A visual examination apparatus is equipped with an inspection tray 1 for holding a constant number of spherical objects in a state arranged horizontally at an equal interval, a feed device 10 for feeding a plurality of the inspection trays 1, a supply hopper 2 for supplying the spherical objects P to the inspection tray 1 by constant quantity, at least first - fourth inspection parts 31-34 successively arranged on the downstream side in the feed direction of the supply hopper 2, and spherical object rotating devices 41-43 arranged between the inspection parts. The inspection of the upper surfaces of the spherical objects and the rotation of the spherical objects are successively repeated in the inspection parts 31-34 with respect to the spherical objects fed by the inspection tray 1, to inspect the appearances of the spherical objects at least from four directions to inspect the appearances of the entire surfaces of the spherical objects.
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