发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PURPOSE: To provide a semiconductor device and its manufacturing method provided with Cu-based wiring without producing a phenomenon wherein the insulation film of wiring circumference peels. CONSTITUTION: The semiconductor device is provided with an insulation layer (2) formed on a semiconductor substrate (1), a wiring pattern groove (3) formed on the insulation layer (2), a conductive spreading prevention layer (4) formed on the inner face of the wiring pattern groove (3), and the Cu-based wiring (6) formed in the wiring pattern groove forming a conductive spreading prevention layer (4). The content of sulfur of the Cu-based wiring (6) is 100 atom ppm or more and 1 atom.% or less.
申请公布号 KR20020054270(A) 申请公布日期 2002.07.06
申请号 KR20010085019 申请日期 2001.12.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUNAGA NORIAKI;SHIMOOKA YOSHIAKI
分类号 H01L21/3205;H01L21/28;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/28 主分类号 H01L21/3205
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