发明名称 |
Methods of manufacturing a metal pattern of a semiconductor device which include forming nitride layer at exposed sidewalls of Ti layer of the pattern |
摘要 |
A method of manufacturing a metal pattern of a semiconductor device. A Ti layer and a metal layer are successively formed on a semiconductor substrate or on an insulating layer. Then, a wiring pattern including a Ti layer pattern and a metal layer pattern is formed by patterning said Ti layer and the metal layer. Heat treating is employed under an atmosphere of a compound including nitrogen in order to react an exposed portion of the Ti layer pattern to form TiN as a main product, thereby increasing the stability and adhesiveness of the metal layer for subsequent processes.
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申请公布号 |
US6451691(B2) |
申请公布日期 |
2002.09.17 |
申请号 |
US20010794616 |
申请日期 |
2001.02.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SONG WON-SANG;PARK IN-SUN;KOO KYUNG-BUM;KIM YOUNG-CHEON |
分类号 |
H01L21/28;H01L21/3213;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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