发明名称 Methods of manufacturing a metal pattern of a semiconductor device which include forming nitride layer at exposed sidewalls of Ti layer of the pattern
摘要 A method of manufacturing a metal pattern of a semiconductor device. A Ti layer and a metal layer are successively formed on a semiconductor substrate or on an insulating layer. Then, a wiring pattern including a Ti layer pattern and a metal layer pattern is formed by patterning said Ti layer and the metal layer. Heat treating is employed under an atmosphere of a compound including nitrogen in order to react an exposed portion of the Ti layer pattern to form TiN as a main product, thereby increasing the stability and adhesiveness of the metal layer for subsequent processes.
申请公布号 US6451691(B2) 申请公布日期 2002.09.17
申请号 US20010794616 申请日期 2001.02.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SONG WON-SANG;PARK IN-SUN;KOO KYUNG-BUM;KIM YOUNG-CHEON
分类号 H01L21/28;H01L21/3213;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/44 主分类号 H01L21/28
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