发明名称 SINGLE CRYSTAL SUBSTRATE MANUFACTURING METHOD AND INTEGRATED CIRCUIT FORMED THEREON
摘要 PROBLEM TO BE SOLVED: To manufacture a single crystal substrate allowing a silicon epitaxial layer having no crystal defect to be formed thereafter. SOLUTION: The manufacturing method comprises a step of forming an initial single crystal substrate having at least one crystal lattice discontinuity locally on the surface, recessing the discontinuous spot of the initial substrate, making a crystal lattice around the recess amorphous, depositing a layer of an amorphous material having the same chemical composition as the initial substrate on an obtained structure, and thermally annealing the obtained structure to re-crystallize the amorphous portions so as to continue the single crystal lattice of the initial substrate.
申请公布号 JP2002270509(A) 申请公布日期 2002.09.20
申请号 JP20010394184 申请日期 2001.12.26
申请人 ST MICROELECTRONICS SA 发明人 MENUT OLIVIER;GRIS YVON
分类号 H01L21/76;H01L21/20;H01L21/205;H01L21/329;H01L21/762;H01L21/822;H01L27/04;H01L29/861;(IPC1-7):H01L21/20 主分类号 H01L21/76
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