| 摘要 |
An IC test system includes a socket having a plurality of contact pins, a positioning member for positioning an IC package for testing, a carriage arm for transferring the IC package positioned by the positioning member to the socket. The socket, positioning member and the carriage arm are fixed to the base of the test system via a common base plate. Vibration caused by the carriage arm is commonly transferred to the socket and the positioning member, whereby a suitable alignment of IC package with respect to the socket can be obtained.
|
