发明名称 SUB WORD LINE DRIVING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A sub word line driving circuit of a semiconductor memory device is provided, which enables a stable refresh, by preventing a voltage of an inactive sub word line from being increased due to an electrostatic capacity with an adjacent sub word line. CONSTITUTION: A sub word line driving part(10) comprises a PMOS transistor(11) whose gate is connected to a main word line and its drain is connected to a sub word line driving signal(PX signal) input port and the first NMOS transistor(12) whose gate is connected to the main word line and its source is connected to a ground port. The NMOS transistor is connected to the source of the PMOS transistor in serial. A discharge part(20) is connected to an output port of the sub word line driving part and discharges charges increasing in the sub word line in response to a discharge part driving signal(PX bar) while an adjacent word line is activated. And a switching part(30) is connected serially to the discharge part and applies a negative voltage to the inactivated sub word line during an initial activation period of the adjacent word line.
申请公布号 KR20020078992(A) 申请公布日期 2002.10.19
申请号 KR20010019521 申请日期 2001.04.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 AHN, GYEONG JUN;LEE, HYEON U
分类号 G11C8/08;(IPC1-7):G11C8/08 主分类号 G11C8/08
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