发明名称 |
Scanning laser beam electrical circuit inspection system |
摘要 |
An automated optical inspection system is operative to convey an electrical circuit to be inspected in a first direction. While the electrical circuit is being conveyed a laser beam scanner scans a laser beam in second direction, generally perpendicular to the first direction, and a fluorescence detector detects fluorescence produced by impingement of the laser beam on portions of the electrical circuit. The fluorescence detector receives fluorescence sequentially from portions of the electrical circuit illuminated by the laser beam as a result of both conveying of the electrical circuit and scanning of the laser beam in the second direction.
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申请公布号 |
US2002163348(A1) |
申请公布日期 |
2002.11.07 |
申请号 |
US20010846999 |
申请日期 |
2001.05.01 |
申请人 |
ORBOTECH LTD. |
发明人 |
HAREL EYAL;DOLLBERG YEHOSHUA;LAVI BEN-ZION |
分类号 |
G01R31/309;(IPC1-7):G01R31/302 |
主分类号 |
G01R31/309 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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