发明名称 Two step plasma etch using variable electrode spacing
摘要 A method of etching in a plasma etching chamber having an upper electrode and a susceptor is disclosed. The method comprises: setting the upper electrode and the susceptor to a first predetermined distance; performing a first etch at the first predetermined distance for a first predetermined time; setting the upper electrode and the susceptor to a second predetermined distance; and performing a first etch at the second predetermined distance for a second predetermined time.
申请公布号 US6482744(B1) 申请公布日期 2002.11.19
申请号 US20000640488 申请日期 2000.08.16
申请人 PROMOS TECHNOLOGIES, INC. 发明人 WU CHAO-CHUEH
分类号 H01J37/32;(IPC1-7):H01L21/311 主分类号 H01J37/32
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