发明名称 LITHOGRAPHIC APPARATUS, METHOD FOR FABRICATING DEVICE, AND DEVICE FABRICATED THEREBY
摘要 PURPOSE: A lithographic apparatus is provided to predict the momentary substrate table position error and feed it into a mask table control loop, adding it to a mask table set point and as a force to the mask table. CONSTITUTION: A radioactive rays system supplies a projection beam of radioactive rays. A support structure supports a patterning unit functioning to pattern the projection beam. A substrate table holds a substrate. A projection system projects the projection beam patterned by a floating target of the substrate. The first driving unit transfers the support structure in a given reference direction substantially parallel with the plane of the patterning unit. The second driving unit transfers the substrate table in a direction parallel with the reference direction to synchronize with the motion of the support structure. The first measuring unit determines a momentary position of the patterning unit regarding a fixed reference point. The second measuring unit determines a momentary position of the substrate table regarding a fixed reference point. A position error signal generating unit compares a predetermined momentary position of the substrate table with the measured momentary position of the substrate table and generates a position error signal according to a difference between the positions. A prediction unit generates a future position error signal based on at least one position error signal and transfers the future position error signal to a correction unit functioning to control the momentary position of the patterning unit and compensate for the difference.
申请公布号 KR20020093601(A) 申请公布日期 2002.12.16
申请号 KR20020031674 申请日期 2002.06.05
申请人 ASML NETHERLANDS B.V. 发明人 BUTLER HANS
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
代理机构 代理人
主权项
地址