发明名称 Polishing pad
摘要 A polishing pad has a first layer, a second layer, a hole and a plug. The hole is formed in the polishing pad and has a first section in the first layer of the polishing pad and a second section in a second layer of the polishing pad. The plug is embedded in the hole and has an upper portion and a lower portion. The upper portion of the plug fits into the first section of the hole, and the lower portion of the plug fits into the second section of the hole. Since the plug has a height of the polishing pad, the problem of depositions, such as water droplets, has been solved. The endpoint detection can thus be precisely controlled.
申请公布号 US6524176(B1) 申请公布日期 2003.02.25
申请号 US20020063136 申请日期 2002.03.25
申请人 MACRONIX INTERNATIONAL CO. LTD. 发明人 CHENG CHIH-HSIEN;LIU YUH-TURNG
分类号 B24B37/04;B24D7/12;(IPC1-7):B24D11/00 主分类号 B24B37/04
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