| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which power consumption is low and a sure operation margin test can be performed and a test method for semiconductor integrated circuit. SOLUTION: In a normal time, a TEST flag signal is 'L', a switch SWA is turned on, a switch SWB is turned off, an output of a first boosting circuit 104 is supplied to a memory core 107 and a voltage drop power source 108. In a test time, a TEST flag signal is 'H', a switch SWA is turned off, a switch SWB is turned on, an external power source for test of which voltage is varied is connected to the memory core 107 through an external power source connection terminal 101, an output of a second boosting circuit 105 is supplied to the voltage drop power source 108. COPYRIGHT: (C)2003,JPO
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