发明名称
摘要 PURPOSE:To obtain high sensitivity to KrF excimer laser and durability against oxygen plasma by constituting the compsn. of a specified resin and photo acid generating agent. CONSTITUTION:This compsn. is produced by adding one of sulfonium salts, sulfonate compds., iodonium salts, and halogenated compds. as a photo acid generating agent to a resin having a chemical structure of the formula. In the formula, R1 is H, an alkyl group, halogen, phenyl group, halogenated alkyl group or CN, R2 is a group which is released with acid. Since the content of Si in the compsn. (resist) can be increased, a thicker resist film as a lower layer can be etched to obtain a pattern with high aspect ratio. Thus, the obtd. compsn. can be used, for example, in a production process of semiconductor integrated circuit devices and micromachining process which require microfabrication.
申请公布号 JP3438103(B2) 申请公布日期 2003.08.18
申请号 JP19940007364 申请日期 1994.01.27
申请人 发明人
分类号 G03F7/039;G03F7/004;G03F7/029;G03F7/075;H01L21/027;(IPC1-7):G03F7/075 主分类号 G03F7/039
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