发明名称 Gate-tunable atomically-thin memristors and methods for preparing same and applications of same
摘要 In one aspect of the invention, the memristor includes a monolayer film formed of an atomically thin material, where the monolayer film has at least one grain boundary (GB), a first electrode and a second electrode electrically coupled with the monolayer film to define a memristor channel therebetween, such that the at least one GB is located in the memristor channel, and a gate electrode capacitively coupled with the memristor channel.
申请公布号 US9515257(B2) 申请公布日期 2016.12.06
申请号 US201615045822 申请日期 2016.02.17
申请人 NORTHWESTERN UNIVERSITY 发明人 Hersam Mark C.;Sangwan Vinod K.;Jariwala Deep M.;Kim In Soo;Marks Tobin J.;Lauhon Lincoln J.
分类号 H01L45/00;H01L27/16;H01L27/24 主分类号 H01L45/00
代理机构 Locke Lord LLP 代理人 Locke Lord LLP ;Xia, Esq. Tim Tingkang
主权项 1. A memristor, comprising: a substrate having a first surface and an opposite, second surface; a monolayer film formed of an atomically thin material on the first surface of the substrate, wherein the monolayer film has at least one grain boundary (GB); a first electrode and a second electrode spatial-apart formed on the first surface of the substrate and electrically coupled with the monolayer film to define a memristor channel in the monolayer film between the first and second electrodes, such that the at least one GB is located in the memristor channel; and a gate electrode formed on the second surface of the substrate and capacitively coupled with the memristor channel.
地址 Evanston IL US