发明名称 |
Gate-tunable atomically-thin memristors and methods for preparing same and applications of same |
摘要 |
In one aspect of the invention, the memristor includes a monolayer film formed of an atomically thin material, where the monolayer film has at least one grain boundary (GB), a first electrode and a second electrode electrically coupled with the monolayer film to define a memristor channel therebetween, such that the at least one GB is located in the memristor channel, and a gate electrode capacitively coupled with the memristor channel. |
申请公布号 |
US9515257(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201615045822 |
申请日期 |
2016.02.17 |
申请人 |
NORTHWESTERN UNIVERSITY |
发明人 |
Hersam Mark C.;Sangwan Vinod K.;Jariwala Deep M.;Kim In Soo;Marks Tobin J.;Lauhon Lincoln J. |
分类号 |
H01L45/00;H01L27/16;H01L27/24 |
主分类号 |
H01L45/00 |
代理机构 |
Locke Lord LLP |
代理人 |
Locke Lord LLP ;Xia, Esq. Tim Tingkang |
主权项 |
1. A memristor, comprising:
a substrate having a first surface and an opposite, second surface; a monolayer film formed of an atomically thin material on the first surface of the substrate, wherein the monolayer film has at least one grain boundary (GB); a first electrode and a second electrode spatial-apart formed on the first surface of the substrate and electrically coupled with the monolayer film to define a memristor channel in the monolayer film between the first and second electrodes, such that the at least one GB is located in the memristor channel; and a gate electrode formed on the second surface of the substrate and capacitively coupled with the memristor channel. |
地址 |
Evanston IL US |