发明名称 |
Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test |
摘要 |
A structure and method for an integrated circuit which includes read/write memory having a plurality of memory devices, each of the memory devices having a unique address; a built-in self-test (BIST) engine, the BIST engine having a controller responsive to a test enable signal and operative to generate and store test data in the read/write memory; a comparator operative to compare retrieved data read from the read/write memory and the test data during a first pass test, the comparator identifying failed cycles where the retrieved data does not correspond correctly to the test data; and a diagnostic unit operative to store the failed cycles and being responsive to the controller generating and storing the test data in the read/write memory and operative to store failed data and failing addresses during a first pass test, wherein the BIST engine stops only at each of the failed cycles during the first pass test.
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申请公布号 |
US6643807(B1) |
申请公布日期 |
2003.11.04 |
申请号 |
US20000629507 |
申请日期 |
2000.08.01 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HEASLIP JAY G.;MAIER GARY W.;SALEM GERARD M.;VON REYN TIMOTHY J. |
分类号 |
G11C29/00;G11C29/44;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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