| 摘要 |
The circuit cell for test methods having a built-in self-test function for modular circuits. The cell has a memory unit for storing data, a combinatorial logic circuit for data processing, and a memory control unit for controlling the memory unit. The memory control unit can be configured such that it sets the memory unit as a test pattern generator in a transmission mode and sets it as a test pattern compression device in a reception mode. The memory control unit produces a synchronizing signal for synchronizing the memory unit on the basis of communication signals which are interchanged by the memory control unit and memory control units in further circuit cells. With these methods, a transmission circuit cell is synchronized locally, so that a global clock signal is not required.
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