发明名称 A DIGITAL SYSTEM AND METHOD FOR TESTING ANALOGUE AND MIXED-SIGNAL CIRCUITS OR SYSTEMS
摘要 A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.
申请公布号 WO03107019(A2) 申请公布日期 2003.12.24
申请号 WO2003GB02599 申请日期 2003.06.17
申请人 UNIVERSITY OF STRATHCLYDE;HAMILTON, DAVID, JAMES;STIMPSON, BRIAN, PHILIP;BEKHEIT, MAHMOUD, ALI, MOUSA 发明人 HAMILTON, DAVID, JAMES;STIMPSON, BRIAN, PHILIP;BEKHEIT, MAHMOUD, ALI, MOUSA
分类号 G01R31/28;G01R31/316;G01R31/3167;G01R31/3183 主分类号 G01R31/28
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