发明名称 |
Mid-infrared spectrometer attachment to light microscopes |
摘要 |
A mid-IR spectrometer attachment performs reflection spectroscopy measurements using commercially available infinity corrected light microscopes without degrading the microscope's performance. The mid-IR spectrometer attachment, which is mounted to and supported by the visible light microscope, introduces infrared radiation into the optical path of the microscope. Radiation from the mid-IR spectrometer source is directed by a trichroic radiation director to a mid-IR objective lens affixed to the microscope nosepiece. The objective lens focuses the radiation on to a subject sample surface in order to acquire either internally or externally reflected infrared spectra by subsequently directing the sample encoded reflected mid-infrared radiation to the radiation director and then to a mid-infrared radiation detection system. The trichroic radiation director can reflect mid-IR, act as a beam splitter for near-IR and transmit visible light to allow the area of mid-IR spectroscopic analysis to be viewed in either visible light or near-IR. |
申请公布号 |
US6693280(B2) |
申请公布日期 |
2004.02.17 |
申请号 |
US20010921461 |
申请日期 |
2001.08.03 |
申请人 |
SENSIR TECHNOLOGIES, L.L.C. |
发明人 |
STING DONALD W.;BURCH ROBERT V.;REFFNER JOHN A.;WILKS DONALD K. |
分类号 |
G01N21/27;G01J3/02;G01N21/35;G02B21/00;G02B21/02;G02B21/06;(IPC1-7):G01J5/02 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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