发明名称 RESONANT TUNNELING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a resonant tunneling semiconductor device, wherein a flow of electrons by way of a point X is decreased to ensure a high P/V ratio and reduce a temperature dependency. SOLUTION: In the resonant tunneling semiconductor device, both sides of a well layer 1 of at least one layer are pinched between a pair of barrier layers. At least one of the pair of barrier layers of the device is constituted of the barrier layer of at least two layers containing a first barrier layer 2 having a bottom of a conductive band energy at a point except for a pointΓand a second barrier layer 3 having a different height in the bottom of the conductive band energy at a point except for the pointΓ. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004071876(A) 申请公布日期 2004.03.04
申请号 JP20020230061 申请日期 2002.08.07
申请人 FUJITSU LTD 发明人 TAGI TOSHIHIRO;OKAMOTO NAOYA
分类号 H01L29/06;H01L29/88;(IPC1-7):H01L29/88 主分类号 H01L29/06
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