发明名称 POLISHING DEVICE FOR PROBE OF PROBE CARD
摘要 PROBLEM TO BE SOLVED: To solve a problem that a polishing piece should be prepared for each of various probe cards in polishing the probe cards having variation in the shape of a probe, and further as the probe is directly kept into contact with the hard polishing piece, the probe is ground down and should be frequently replaced. SOLUTION: This grinding device comprises a lapping film fixing mechanism for curling and folding a strip-shaped lapping film into two without making a fold line, and fixing the overlapped both ends, and a driving mechanism for sliding the fixing mechanism vertically to the direction of the probe. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004082310(A) 申请公布日期 2004.03.18
申请号 JP20020249450 申请日期 2002.08.28
申请人 NEC KYUSHU LTD 发明人 YAMAUCHI NOBUYOSHI;MATSUOKA HIDEKI
分类号 B24B21/00;B24D3/00;B24D11/00;(IPC1-7):B24B21/00 主分类号 B24B21/00
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