发明名称 |
Electrical testing machine |
摘要 |
An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat. |
申请公布号 |
US9459279(B2) |
申请公布日期 |
2016.10.04 |
申请号 |
US201414557043 |
申请日期 |
2014.12.01 |
申请人 |
MPI CORPORATION |
发明人 |
Ku Wei-Cheng;Lu Shao-Wei;Sung Hung-Chih;Chen Chun-Nan |
分类号 |
G01R31/00;G01R1/04;G01R31/28;G01R1/073 |
主分类号 |
G01R31/00 |
代理机构 |
Apex Juris, pllc |
代理人 |
Wylie Lynette;Apex Juris, pllc |
主权项 |
1. An electrical testing machine, which is used to do an electrical testing on a tested portion of a DUT, comprising:
a base having two parallel first rails thereon; a platform provided on the base for the DUT to be placed thereon; a probe holder provided on the base, and having a plurality of placement locations thereon; a support provided on the first rails, wherein the support is movable relative to the base and the platform along the first rails, and has a second rail provided thereon; a test arm provided on the second rail and above the platform, wherein the test arm is movable along with the support, and is also movable relative to the support along the second rail; a receiving seat provided on the test arm to be moved along with the test arm, wherein the receiving seat is also movable or rotatable relative to the test arm; and a plurality of probe sets, wherein one of the probe sets is detachably provided on the receiving seat, while other probe sets are detachably provided on the placement locations of the probe holder respectively, wherein the probe set provided on the receiving seat is movable along with the receiving seat to contact with the tested portion of the DUT placed on the platform to do the electrical testing. |
地址 |
Zhubei TW |