发明名称 Sputter target, barrier film and electronic component
摘要 A sputter target is made of a Ti-Al alloy containing Al in the range of 1 to 30 atm %. In the Ti-Al alloy constituting the sputter target, Al exists in at least one of a solid solution state in Ti and a state in which Al forms an intermetallic compound with Ti, and variation in Al content in the entire target is limited within 10%. Furthermore, an average crystal grain diameter of the Ti-Al alloy is 500 mum or less, and variation in crystal grain diameter in the entire target is limited within 30%. A Ti-Al-N film as a barrier film is formed by using the sputter target made of the Ti-Al alloy as described above. An electronic component includes a barrier film formed on a semiconductor substrate.
申请公布号 US6750542(B2) 申请公布日期 2004.06.15
申请号 US20020257404 申请日期 2002.10.21
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUZUKI YUKINOBU;ISHIGAMI TAKASHI;KOHSAKA YASUO;FUJIOKA NAOMI;WATANABE TAKASHI;WATANABE KOICHI;SANO KENYA
分类号 C23C14/06;C23C14/34;H01L21/02;H01L21/285;H01L21/768;(IPC1-7):H01L23/48 主分类号 C23C14/06
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