发明名称 |
METHOD FOR EVALUATING SUPERCONDUCTIVITY CHARACTERISTIC OF OXIDE HIGH-TEMPERATURE SUPERCONDUCTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a simple and low-cost superconductivity characteristic evaluating method on an oxide high-temperature superconductor for evaluating the concentration of carriers in a CuO<SB>2</SB>surface directly affecting the superconductivity characteristic and evaluating the concentration of carriers in a minute area. SOLUTION: The superconductivity characteristic of the oxide high-temperature superconductor is evaluated from Raman scattering intensity on the CuO<SB>2</SB>surface of the superconductor. When the superconductor 7 has an insulator phase, Raman excitation light 8 is well joined to phonons 11 on the CuO<SB>2</SB>surface 5 since holes 10 for scattering the excitation light 8 are few and the intensity of Raman scattering light 9 is large. When the superconductor 7 has a metallic phase, the excitation light 8 joined to the phonons 11 on the CuO<SB>2</SB>surface 5 is reduced since the holes 10 for scattering the excitation light 8 are many and the intensity of the scattering light 9 is reduced. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004219230(A) |
申请公布日期 |
2004.08.05 |
申请号 |
JP20030006401 |
申请日期 |
2003.01.14 |
申请人 |
JAPAN SCIENCE & TECHNOLOGY AGENCY |
发明人 |
OSADA MINORU;KAKIHANA MASATO |
分类号 |
G01N21/65;(IPC1-7):G01N21/65 |
主分类号 |
G01N21/65 |
代理机构 |
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