Transparent/translucent hollow object e.g. vial, defect inspecting method, involves adjusting exposure of sensors based on intensity of infrared radiation to standardize response of sensor irrespective of origin of objects

摘要

The method involves evaluating intensity of infrared radiation emitted by objects (2) formed in different cavities (4). Exposure of sensors (6) for inspecting the objects is adjusted according to the evaluated intensity of the infrared radiation. The adjustment of the sensor standardizes the response of the sensor during the inspection of the object irrespective of the origin of the objects. An independent claim is also included for an equipment to inspect defect on transparent or translucent hollow object.