发明名称 Non-volatile memory cell with dielectric spacers along sidewalls of a component stack, and method for forming same
摘要 A disclosed method for forming a non-volatile memory cell includes forming a component stack including an electron trapping layer on a substrate surface. A dielectric layer is formed over the component stack, and a portion is removed such that a remainder of the dielectric layer exists substantially along sidewalls of the component stack. An oxide layer is formed over a bit line in the substrate adjacent to the component stack, and an electrically conductive layer is formed over the component stack and the oxide layer. A described non-volatile memory cell includes a component stack on a substrate surface, the component stack including an electron trapping layer. Multiple dielectric spacers are positioned along sidewalls of the component stack. An oxide layer is positioned over a bit line in the substrate adjacent to the component stack, and an electrically conductive layer is positioned over the component stack and the oxide layer.
申请公布号 US2004262664(A1) 申请公布日期 2004.12.30
申请号 US20030609075 申请日期 2003.06.27
申请人 HSU FU-SHIUNG;LIU CHEN-CHIN 发明人 HSU FU-SHIUNG;LIU CHEN-CHIN
分类号 H01L21/28;H01L21/8246;H01L27/115;H01L29/792;(IPC1-7):H01L29/76 主分类号 H01L21/28
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