发明名称 |
Method for fabricating a low temperature polysilicon thin film transistor |
摘要 |
A method of forming a low temperature polysilicon thin film transistor includes steps of: providing a substrate; forming a polysilicon layer on the substrate; forming a gate oxide layer on the polysilicon layer; forming a photoresist pattern on the gate oxide layer; using the photoresist pattern as a mask and etching the gate oxide layer and the polysilicon layer; removing the photoresist pattern; forming a gate on the gate oxide layer; and implanting dopants to form source/drain region by using the gate as a mask.
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申请公布号 |
US2004266075(A1) |
申请公布日期 |
2004.12.30 |
申请号 |
US20040781778 |
申请日期 |
2004.02.20 |
申请人 |
CHEN KUN-HONG |
发明人 |
CHEN KUN-HONG |
分类号 |
H01L21/336;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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