发明名称 HIGH-SIDE FIELD EFFECT TRANSISTOR
摘要 The present invention provides a transistor comprising a substrate having a surface; a first deep well region in the substrate; a second deep well region in the substrate, isolated from and encircling the first deep well region; a first well region in the substrate and on the first deep well region; two second well regions in the second deep well region and respectively at two opposite sides of the first well region; a source region in the first well region and adjacent to the surface; two drain regions in the two second well regions respectively and adjacent to the surface; two gate structures on the surface, wherein each of the two gate structures is between the source region and one of the drain regions respectively; and a guard ring in the substrate encircling the second deep well region, and on the periphery of the transistor.
申请公布号 US2016329408(A1) 申请公布日期 2016.11.10
申请号 US201514706002 申请日期 2015.05.07
申请人 UNITED MICROELECTRONICS CORPORATION 发明人 CHEN YEN-MING;LEE CHIULING;TSAI MIN-HSUAN;CHEN ZHENG HONG;CHANG WEI HSUAN;LIU TSENG-HSUN
分类号 H01L29/423 主分类号 H01L29/423
代理机构 代理人
主权项 1. A high-side field effect transistor, comprising: a substrate having a surface; a first deep well region disposed in the substrate; a second deep well region disposed in the substrate, separated from and encircling the first deep well region; a first well region disposed in the substrate and on the first deep well region; two second well regions disposed in the second deep well region and respectively at two opposite sides of the first well region; a source region disposed in the first well region and adjacent to the surface of the substrate; two drain regions disposed in the two second well regions respectively and adjacent to the surface of the substrate; two gate structures disposed on the surface of the substrate, wherein each of the two gate structures is disposed between the source region and one of the drain regions respectively; and a guard ring disposed in the substrate encircling the second deep well region, and on the periphery of the high-side field effect transistor.
地址 HSINCHU TW