发明名称 |
Identification and operation of sub-prime blocks in nonvolatile memory |
摘要 |
In a block-erasable nonvolatile memory array, blocks are categorized as bad blocks, prime blocks, and sub-prime blocks. Sub-prime blocks are identified from their proximity to bad blocks or from testing. Sub-prime blocks are configured for limited operation (e.g. only storing non-critical data, or data copied elsewhere, or using some additional or enhanced redundancy scheme). |
申请公布号 |
US9501400(B2) |
申请公布日期 |
2016.11.22 |
申请号 |
US201314079460 |
申请日期 |
2013.11.13 |
申请人 |
SanDisk Technologies LLC |
发明人 |
Yeung Chun Sum;Chen Jian;Lee Aaron;Manohar Abhijeet;Avila Chris;Lee Dana;Huang Jianmin |
分类号 |
G06F12/02;G11C29/00;G11C16/34 |
主分类号 |
G06F12/02 |
代理机构 |
Davis Wright Tremaine LLP |
代理人 |
Davis Wright Tremaine LLP |
主权项 |
1. A method of operating blocks of a memory array comprising:
categorizing the blocks into a plurality of categories including prime blocks, sub-prime blocks, and bad blocks; wherein the categorizing includes identifying a bad block from test results obtained from the bad block, and subsequently identifying sub-prime blocks based on their proximity to the bad block; subsequently selecting individual blocks in different planes for parallel operation in metablocks such that each block in a metablock is selected from the same category; configuring metablocks formed from prime blocks as prime metablocks that are operated in a first manner; and configuring metablocks formed from sub-prime blocks as sub-prime metablocks that are operated in a second manner that is different from the first manner. |
地址 |
Plano TX US |