发明名称 Identification and operation of sub-prime blocks in nonvolatile memory
摘要 In a block-erasable nonvolatile memory array, blocks are categorized as bad blocks, prime blocks, and sub-prime blocks. Sub-prime blocks are identified from their proximity to bad blocks or from testing. Sub-prime blocks are configured for limited operation (e.g. only storing non-critical data, or data copied elsewhere, or using some additional or enhanced redundancy scheme).
申请公布号 US9501400(B2) 申请公布日期 2016.11.22
申请号 US201314079460 申请日期 2013.11.13
申请人 SanDisk Technologies LLC 发明人 Yeung Chun Sum;Chen Jian;Lee Aaron;Manohar Abhijeet;Avila Chris;Lee Dana;Huang Jianmin
分类号 G06F12/02;G11C29/00;G11C16/34 主分类号 G06F12/02
代理机构 Davis Wright Tremaine LLP 代理人 Davis Wright Tremaine LLP
主权项 1. A method of operating blocks of a memory array comprising: categorizing the blocks into a plurality of categories including prime blocks, sub-prime blocks, and bad blocks; wherein the categorizing includes identifying a bad block from test results obtained from the bad block, and subsequently identifying sub-prime blocks based on their proximity to the bad block; subsequently selecting individual blocks in different planes for parallel operation in metablocks such that each block in a metablock is selected from the same category; configuring metablocks formed from prime blocks as prime metablocks that are operated in a first manner; and configuring metablocks formed from sub-prime blocks as sub-prime metablocks that are operated in a second manner that is different from the first manner.
地址 Plano TX US