发明名称 DATA INTEGRITY CHECK WITHIN A DATA PROCESSING SYSTEM
摘要 A memory system includes a memory array, control circuitry, and comparator circuitry. The memory array includes a first section having a first plurality of programmed bitcells having a first threshold voltage distribution and a second section having a second plurality of programmed bitcells having a second threshold voltage distribution which has a lower average threshold voltage than the first threshold voltage distribution. The first plurality and second plurality of programmed bitcells are programmed with a same set of data values. The control circuitry is configured to provide a read request to the memory array and receive read data in response to the read request, wherein the read data comprises first read data from the first section and second read data from the second section. The comparator circuitry is configured to compare the first read data to the second read data and generate an error indicator in response to the compare.
申请公布号 US2016350164(A1) 申请公布日期 2016.12.01
申请号 US201514722632 申请日期 2015.05.27
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 CUNNINGHAM JEFFREY C.;SCOULLER ROSS S.
分类号 G06F11/07;G11C29/52;G11C7/00;G06F11/10 主分类号 G06F11/07
代理机构 代理人
主权项 1. A memory system, comprising: a memory array, wherein the memory array comprises a first section having a first plurality of programmed bitcells having a first threshold voltage distribution and a second section having a second plurality of programmed bitcells having a second threshold voltage distribution which has a lower average threshold voltage than the first threshold voltage distribution, wherein the first plurality and second plurality of programmed bitcells are programmed with a same set of data values; control circuitry configured to provide a read request to the memory array and receive read data in response to the read request, wherein the read data comprises first read data from the first section and second read data from the second section; and comparator circuitry configured to compare the first read data to the second read data and generate an error indicator in response to the compare.
地址 Austin TX US