发明名称 |
MASK FOR USE IN A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS |
摘要 |
The mask has a pattern of opaque structures applied on a support (28), where the opaque structures comprise coarser large-area structures and finer bar-like structures (32c). Transparent intermediate spaces (36, 36`) remaining between the bar-like structures (32c) are filled with a liquid or solid dielectric material (38, 38`). The opaque structures consist of an electrically conductive material. Independent claims are also included for the following: (A) a microlithographic projection exposure apparatus for the production of microstructured components (B) a method for the microlithographic production of a microstructured component (C) a method for producing a mask for use in a microlithographic projection exposure apparatus. |
申请公布号 |
KR20050045871(A) |
申请公布日期 |
2005.05.17 |
申请号 |
KR20040091172 |
申请日期 |
2004.11.10 |
申请人 |
CARL ZEISS SMT AG |
发明人 |
GRUNER, TORALF;HETZLER, JOCHEN;TOTZECK, MICHAEL |
分类号 |
G02F1/13;G03B27/42;G03C5/00;G03F1/00;G03F7/20;G03F9/00;H01L21/027 |
主分类号 |
G02F1/13 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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