发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device, capable of preventing an insulating film from being peeled off due to stress. SOLUTION: First dummy wiring which is not used as a circuit is formed on a 1st inter-layer insulating film formed on a semiconductor substrate, a 2nd inter-layer insulating film having a via plug connected to the 1st dummy wiring is formed, a 3rd inter-layer insulating film having a groove for wiring a 2nd dummy wiring which is not used as a circuit is formed to make the upper surface of a via plug exposed, metal is formed on the wiring groove and the 3rd inter-layer insulating film, and then the metal is polished, in order to remote the metal formed on the 3rd inter-layer insulating film. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005142351(A) 申请公布日期 2005.06.02
申请号 JP20030377040 申请日期 2003.11.06
申请人 NEC ELECTRONICS CORP 发明人 OZAWA TAKESHI
分类号 H01L23/52;H01L21/02;H01L21/3205;H01L21/4763;H01L21/768;H01L23/00;H01L23/498;H01L23/522;H01L23/532;(IPC1-7):H01L21/320 主分类号 H01L23/52
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