发明名称 SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE AND THEIR MANUFACTURING METHODS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having high reliability and to provide an electronic device and methods of manufacturing them. SOLUTION: The semiconductor device includes a substrate 10 having a wiring pattern 20 including a plurality of lands 22, and a semiconductor chip 30 having a plurality of electrodes 32 and mounted on the substrate 10 so that the electrodes 32 are opposed to the lands 22. The plurality of the lands 22 are arranged so as to be divided into a plurality of first groups 110 along a plurality of parallel first straight lines 310 to form a profile which is enlarged in a direction along the first straight line 310. The plurality of the electrodes 32 are arranged so as to be divided into a plurality of second groups 130 along the plurality of parallel second straight lines 330 to form a profile which is enlarged in a direction crossed with the second straight line 330. The lands 22 and the electrodes 32 are electrically connected by overlapping so that the longitudinal directions are crossed. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175266(A) 申请公布日期 2005.06.30
申请号 JP20030414829 申请日期 2003.12.12
申请人 SEIKO EPSON CORP 发明人 YUZAWA HIDEKI
分类号 H05K1/14;G02F1/1345;H01L21/4763;H01L21/60;H01L23/48;H01L23/498;H05K3/36;(IPC1-7):H01L21/60 主分类号 H05K1/14
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