发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which maintains an IE effect and improves a breakdown strength. SOLUTION: In an IEGT 1 having a dummy cell region DC, a narrow second emitter layer 32 is selectively formed on the surface layer of a dummy base layer 18, and the base layer 18 is connected to an emitter electrode 28 through this second emitter layer 32 and a via contact 30, and the resistance value of a floating resistor 34 is adjusted by shapes of the second emitter layer 32 and the via contact 30. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005203550(A) 申请公布日期 2005.07.28
申请号 JP20040008042 申请日期 2004.01.15
申请人 TOSHIBA CORP 发明人 OKUNO TAKAHIRO;TANAKA MASAHIRO
分类号 H01L29/786;H01L29/06;H01L29/739;H01L29/78;H01L31/0328;(IPC1-7):H01L29/78 主分类号 H01L29/786
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